TXRF Meeting 2017

From 19 to 22 September 2017, the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods took place in Brescia, Italy. The Fittschen working group was present with four talks and three posters.

 

From 19 to 22 September 2017, the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods took place in Brescia, Italy. The Fittschen working group was present with four talks and three posters.