DXC 2025 in Light of "From Waste to Resource: Nanoplastics, Circular Chemistry, and Microanalysis"

From August 4 to 8, 2025, the 74th Denver X-ray Conference on Applications of X-ray Analysis took place in Rockville, MD, near Washington, D.C., with a total of 334 participants. It is unique for its large exhibition of equipment component manufacturers and its focus on data acquisition. The conference is organized by the ICDD (International Center of Diffraction Data) and MDI (Material Data). Clausthal University of Technology was represented by three participants: Prof. Dr. Michael Fischlschweiger, Thore Pohl, and Prof. Dr. Ursula Fittschen. Dr. Sven Hampel from DESY, a graduate of Clausthal University of Technology, also attended.

The main focus of the conference is the “Plenary Session,” during which outstanding scientists present on a rotating topic. This year, Prof. Dr. em. Peter Wobrauscheck from the Vienna University of Technology organized the plenary session titled “From Waste to Resource: Nanoplastics, Circular Chemistry, and Microanalysis.” The session featured excellent presentations on the topic by Prof. Dr. Florian Meirer from Utrecht University on the analysis of nanoplastics, by Prof. Dr. Michael Fischlschweiger from TUC on combining simulation and material data in the recovery of critical materials from EOF Li-ion batteries, and Dr. Stefan Vogt from Argonne National Laboratory on the status of the upgrade to the Advanced Photon Source at ANL. The photo shows the presenters, from left to right: Prof. Dr. Fischlschweiger, Prof. Dr. Meirer, Dr. Vogt, and the chair, Prof. Dr. Wobrauscheck.

The Fittschen Working Group participated with a poster by Frithjof Mähler on the topic of laboratory XANES of slag, which attracted a large audience. The “General XRF” session, organized by Ursula Fittschen, was also very well attended, and there were lively discussions regarding the various presentations. The three keynote presentations by Dr. Burkhard Beckhoff from the PTB, Dr. Sven Hampel from DESY, and Prof. Dr. Christina Streli from the Vienna University of Technology were particularly well received. Another highlight was the presentation of the Jenkins Award for Lifetime Achievement to Dr. George Havrilla of Los Alamos National Laboratory, who has made significant contributions to micro-X-ray fluorescence analysis in the laboratory, particularly through the development of 3D confocal micro-XRF. The next Denver Conference will take place in Lombard, near Chicago, to mark its 75th anniversary.