Participation at the Denver X-ray Conference 2026

From August 3 to 7, 2026, the 75th Denver X-ray Conference on Applications of X-ray Analysis took place in Lombard, IL, near Chicago, with a total of 301 participants. The conference is unique for its large exhibition of equipment component manufacturers and its focus on data acquisition. The conference is organized by the ICDD (International Center of Diffraction Data) and MDI (Material Data). The IAAC was represented by three participants—Franziska Sand, Frithjof Maehler, and Prof. Dr. Ursula Fittschen—and presented four papers. Franziska Sand presented a poster and a talk on the topic: film formation using pL-printing and Frithjof Mähler gave a talk on the topic: laboratory XES determination of oxidation state of 3d-elements. Both also received the Snyder Travel Award for students.

The main focus of the conference is the “Plenary Session,” during which outstanding scientists present on a rotating theme. This year, as DXC celebrates its 75th anniversary, the title of the plenary session was “75 Years of Brilliance: Honoring Our Past, Shaping DXC’s Future.” On this topic, there were outstanding presentations by Dr. Timothy Fawcett of the ICDD on “75 Years of Learning and Development in Materials Analysis,” by Prof. Dr. Ursula Fittschen of TUC on “X-ray-Based Microanalysis and Materials Characterization,” and by Prof. Dr. Chris Jacobson of Northwestern University on “X-Rays Coming into Focus: Past and Future Journeys toward Nanoimaging.”

Clausthal University of Technology was also actively involved in the workshop on TXRF and micro-XRF organized by Prof. Dr. Kouichi Tsuji from Osaka City University, in the General XRF session, and in the session titled “Synergy of Computational Materials and Process Engineering Modeling with Materials Characterization,” which was organized in collaboration with Prof. Dr. Dr. Michael Fischlschweiger and Prof. Dr. Tim Zeiner from KIT.

Another highlight was the presentation of the Birks Award for outstanding achievement in X-ray fluorescence analysis to Dr. Burkhard Beckhoff of the PTB, who has made significant contributions to standard-free X-ray fluorescence analysis.

The next DXC will take place August 2–7, 2027, at Westminster Denver in Colorado, USA.